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JEOL Announces Release of the New Scanning Electron Microscope JSM-IT700HR

Based on their award-winning predecessor of “InTouchScope™” series SEMs, the JSM-IT700HR is equipped with their in-lens Schottky field emission electron gun (FEG). This new powerful SEM satisfies the needs for observation and analysis of further miniaturized materials in daily laboratory operation.

Release of a New Benchtop Scanning Electron Microscope JCM-7000 Series NeoScopeTM by JEOL Ltd.

3/11/19: Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries.